4. Develop and Test Models

Use the ACTUATORS to exercise the Model and View elements.
Click on a View element to simulate a fault.
Click again to clear the fault condition.

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The PNP_MVL system configuration implements the layered Model+View testing architecture for the pick and place example.
  • The HMI devices encapsulates the functionality of the corresponding layer of the architecture, while the PNP device encapsulates the functionality of the Model and View layers.
  • As in the PNP_VIEWL configuration, the PNP device contains an instance of the specialized VIEW_PANEL resource type to provide the necessary layout of View elements for the pick and place example.
  • The CONVEYOR and XY resources contain the Model elements for the physical elements of the pick and place example. An instance of the XY_MDLL type models the pick and place mechanism, and an instance of the CNV_MDLL type models the conveyor.
  • The PRESENT sensor (workpiece present at end of conveyor) is modeled by an instance of the V_SENSE type.
  • The logic for loading and unloading a workpiece with the electromagnet and detecting its presence there (the LOADED sensor) is modeled by an instance of the E_LDU type inside the composite XY_MDLL type.
  • Inter-layer communication is implemented with the local multicast pattern.
  • The x- and y-axis overcurrent sensors are modeled by a single fault signal that is published on the FAULT local channel. This signal is set and cleared by the user by clicking in the two-axis mechanism view, and when set causes motion to cease immediately independent of any control actions.
  • The CLOCK resource contains the simulation clock, which is also distributed via the local multicast mechanism.
Last updated: 2015-04-07.
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